Inspecting apparatus and inspecting method for circuit board
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Oct 25, 2005
Grant Date -
Jan 2, 2003
app pub date -
Nov 15, 2001
filing date -
Nov 17, 2000
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The present invention provides an apparatus and method for inspecting a circuit board at a high speed. A PDP driver module 100 as an object to be inspected has an onboard PDP driving LSI 110. A plurality of circuit wirings 111 are connected to terminals of the LSI. An inspection apparatus 1 generates an LSI drive signal and sends it to input terminals 113 of the LSI 110. A sensor 2 is positioned opposedly to the circuit wirings 111 in a non-contact manner. The sensor 2 detects voltage values in circuit wirings 111 caused by driving the LSI 110, and the detected signals are analyzed by the inspection apparatus 1.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully