Variable impedance test probe
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 29, 2005
Grant Date -
Aug 26, 2004
app pub date -
Feb 20, 2003
filing date -
Feb 20, 2003
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A variable impedance test probe of the present invention comprises a first signal conductor, a first ground reference conductor, and a first dielectric element disposed between the first signal conductor and the first ground reference conductor. The dielectric element is configured to selectively vary an impedance of the first signal conductor relative to the ground reference conductor.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully