Thermometry probe calibration method

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Dec 6, 2005
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Oct 10, 2003
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Oct 11, 2002

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Abstract

A method in which thermal mass and manufacturing differences are compensated for in thermometry probes by storing characteristic data relating to individual probes into an EEPROM for each probe which is used by the temperature apparatus.

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Patent Owner(s)

Patent Owner	Address
WELCH ALLYN INC	4341 STATE STREET ROAD SKANEATELES FALLS NY 13153

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G01K:MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT;....

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Inventor Name	Address	# of filed Patents	Total Citations
Burdick, Kenneth J	Skaneateles, NY	10	472
Cuipylo, William N	Auburn, NY	6	202
Lane, John	Weedsport, NY	59	1723
Quinn, David E	Weedsport, NY	127	1920
Stone, Ray D	San Diego, CA	23	851

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Thermometry probe calibration method

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United States of America Patent

10683206

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US Family Size	Non-US Coverage
Patent Longevity	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
December 06, 2005	US,6971790,B2 US6971790B2	GRANTED PATENT AS SECOND PUBLICATION
June 17, 2004	US,20040114659,A1 US20040114659A1	FIRST PUBLISHED PATENT APPLICATION

PATENT NO	6971790
SERIAL NO	10683206
DOCKET NO

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10683206

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