Method and apparatus for making high-precision measurements
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United States of America Patent
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Jan 10, 2006
Issued Date -
N/A
app pub date -
Jun 3, 2004
filing date -
Apr 28, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus for measuring a predetermined parameter, by providing a displaceable sensor on a mounting member such that the displaceable sensor changes in location, form or length with respect to the mounting member in accordance with the predetermined parameter. A cyclically-repeating energy wave is transmitted to or through the displaceable sensor, and a predetermined fiducial point in the received cyclically-repeating energy wave is detected and used for continuously changing the frequency of the transmitted cyclically-repeating energy wave such that the number of waves received is a whole integer. The change in frequency is used to produce a measurement of the predetermined parameter. Several embodiments are described wherein the displaceable sensor is a deformable membrane, an end wall of a bellows, a spring-mounted member, a displaceable plunger, and a bar changing its length in accordance with the parameter to be measured.
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