Dynamic metrology sampling methods, and system for performing same
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United States of America Patent
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Jan 17, 2006
Grant Date -
Feb 10, 2005
app pub date -
Aug 4, 2003
filing date -
Aug 4, 2003
priority date (Note) -
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Abstract
The present invention is generally directed to various methods and systems for adaptive metrology sampling plans that may be employed to monitor various manufacturing processes. In one example, the method includes creating a plurality of metrology sampling rules, assigning each of the metrology sampling rules a sampling weight value, identifying at least one workpiece that satisfies at least one of the metrology sampling rules, assigning the sampling weight value for each of the satisfied metrology sampling rules with the identified workpieces that satisfy the rules, and indicating a metrology operation should be performed when a cumulative total of the sampling weight values is at least equal to a pre-established trigger value.
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