Multi-step magnetron sputtering process

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United States of America Patent

PATENT NO 6991709
SERIAL NO

10934231

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Abstract

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A multi-step sputtering process in plasma sputter reactor having target and magnetron operable in two modes, for example, in a substrate sputter etch and a substrate sputter deposition. The target has an annular vault facing the wafer to be sputter coated. Various types of magnetic means positioned around the vault create a magnetic field supporting a plasma extending over a large volume of the vault. An integrated copper via filling process with the inventive reactor or other reactor includes a first step of highly ionized sputter deposition of copper, which can optionally be used to remove the barrier layer at the bottom of the via, a second step of more neutral, lower-energy sputter deposition of copper to complete the seed layer, and a third step of electroplating copper into the hole to complete the metallization. The first two steps can be also used with barrier metals.

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Patent Owner(s)

Patent OwnerAddress
APPLIED MATERIALS INCSANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Fusen Saratoga, CA 68 3066
Dixit, Girish San Jose, CA 64 2505
Fu, Jianming San Jose, CA 136 4865
Gopalraja, Praburam Sunnyvale, CA 101 3789
Sinha, Ashok K Palo Alto, CA 56 4714
Wang, Wei Santa Clara, CA 2815 17926
Xu, Zheng Foster City, CA 334 5242

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