Birefringence measurement of large-format samples
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United States of America Patent
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Jan 31, 2006
Grant Date -
Apr 22, 2004
app pub date -
Feb 5, 2003
filing date -
Oct 16, 2002
priority date (Note) -
In Force
status (Latency Note)
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Abstract
The disclosure is directed to systems and methods for precisely measuring birefringence properties of large-format samples of optical elements. A gantry-like configuration is employed for precise movement of birefringence measurement system components relative to the sample. There is also provided an effective large-format sample holder that adequately supports the sample to prevent induced birefringence therein while still presenting a large area of the sample to the unhindered passage of light.
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