Method for fault tracing in electronic measurement and test arrangements for electrochemical elements
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United States of America Patent
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Feb 7, 2006
Grant Date -
Sep 23, 2004
app pub date -
Nov 10, 2003
filing date -
Mar 20, 2003
priority date (Note) -
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Abstract
A method for fault tracing in automatically operating electronic measurement and test arrangements for a large number of electrochemical elements, wherein holders for the electrochemical elements are provided on the measurement and test arrangements and wherein cell simulators are provided with an external shape and size, including electrical connections, which approximately simulate one of the electrochemical elements to be tested, and contain test electronics, with a behaviour of the cell simulators with inverse polarity differing to a major extent from a behaviour with polarity based on the application, including the steps of inserting of the cell simulators into the holders, activating one of the cell simulators and applying a measurement current applied to it, measuring the voltage on the cell simulator and comparing the voltage with the nominal voltage predetermined for the cell simulator.
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