Image projection systems
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United States of America Patent
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Feb 14, 2006
Grant Date -
N/A
app pub date -
Sep 22, 1999
filing date -
Sep 22, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of determining the location of an optical feature in an image projection system, the method comprising: 1) projecting a first image of the feature onto a detector with a lens in a first position; 2) sensing, with the detector, the position of the first image of the feature; 3) projecting a second image of the feature onto a detector with a lens in a second position laterally spaced from the first position; 4) sensing, with the detector, the position of the second image of the feature; and 5) deducing the location of the defect from the difference between the positions sensed in steps 2) and 4).
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