| 7,355,420 Membrane probing system
|
3 |
2002
|
| 7,178,236 Method for constructing a membrane probe using a depression
|
5 |
2003
|
| 7,250,779 Probe station with low inductance path
|
23 |
2003
|
| 7,761,986 Membrane probing method using improved contact
|
1 |
2003
|
| 7,368,925 Probe station with two platens
|
3 |
2004
|
| 7,400,155 Membrane probing system
|
0 |
2004
|
| 7,250,626 Probe testing structure
|
3 |
2004
|
| 7,221,172 Switched suspended conductor and connection
|
23 |
2004
|
| 7,492,172 Chuck for holding a device under test
|
4 |
2004
|
| 7,268,533 Optical testing device
|
3 |
2004
|
| 7,187,188 Chuck with integrated wafer support
|
74 |
2004
|
| 7,427,868 Active wafer probe
|
10 |
2004
|
| 7,266,889 Membrane probing system
|
7 |
2005
|
| 7,221,146 Guarded tub enclosure
|
5 |
2005
|
| 7,589,518 Wafer probe station having a skirting component
|
5 |
2005
|
| 7,554,322 Probe station
|
5 |
2005
|
| 7,330,041 Localizing a temperature of a device for testing
|
5 |
2005
|
| 7,330,023 Wafer probe station having a skirting component
|
3 |
2005
|
| 7,176,705 Thermal optical chuck
|
3 |
2005
|
| 7,368,927 Probe head having a membrane suspended probe
|
19 |
2005
|
| 7,352,168 Chuck for holding a device under test
|
9 |
2005
|
| 7,420,381 Double sided probing structures
|
1 |
2005
|
| 7,348,787 Wafer probe station having environment control enclosure
|
3 |
2005
|
| 7,656,172 System for testing semiconductors
|
3 |
2006
|
| 7,535,247 Interface for testing semiconductors
|
3 |
2006
|
| 7,271,603 Shielded probe for testing a device under test
|
32 |
2006
|
| 7,221,174 Probe holder for testing of a test device
|
0 |
2006
|
| 7,449,899 Probe for high frequency signals
|
0 |
2006
|
| 7,619,419 Wideband active-passive differential signal probe
|
0 |
2006
|
| 7,550,983 Membrane probing system with local contact scrub
|
0 |
2006
|
| 7,205,784 Probe for combined signals
|
2 |
2006
|
| 7,250,752 Probe station having multiple enclosures
|
3 |
2006
|
| 7,403,025 Membrane probing system
|
2 |
2006
|
| 7,295,025 Probe station with low noise characteristics
|
6 |
2006
|
| 7,292,057 Probe station thermal chuck with shielding for capacitive current
|
3 |
2006
|
| 7,533,462 Method of constructing a membrane probe
|
0 |
2006
|
| 7,504,823 Thermal optical chuck
|
2 |
2006
|
| 7,321,233 System for evaluating probing networks
|
7 |
2007
|
| 7,362,115 Chuck with integrated wafer support
|
14 |
2007
|
| 7,764,072 Differential signal probing system
|
1 |
2007
|
| 7,723,999 Calibration structures for differential signal probing
|
0 |
2007
|
| 7,403,028 Test structure and probe for differential signals
|
19 |
2007
|
| 7,285,969 Probe for combined signals
|
1 |
2007
|
| 7,443,186 On-wafer test structures for differential signals
|
2 |
2007
|
| 7,639,003 Guarded tub enclosure
|
2 |
2007
|
| 7,504,842 Probe holder for testing of a test device
|
0 |
2007
|
| 7,468,609 Switched suspended conductor and connection
|
4 |
2007
|
| 7,688,097 Wafer probe
|
1 |
2007
|
| 7,609,077 Differential signal probe with integral balun
|
0 |
2007
|
| 8,069,491 Probe testing structure
|
0 |
2007
|
| 7,498,828 Probe station with low inductance path
|
5 |
2007
|
| 7,436,170 Probe station having multiple enclosures
|
3 |
2007
|
| 7,492,147 Wafer probe station having a skirting component
|
3 |
2007
|
| 7,681,312 Membrane probing system
|
0 |
2007
|
| 7,541,821 Membrane probing system with local contact scrub
|
0 |
2007
|
| 7,453,276 Probe for combined signals
|
0 |
2007
|
| 7,518,387 Shielded probe for testing a device under test
|
1 |
2007
|
| 7,550,984 Probe station with low noise characteristics
|
3 |
2007
|
| 7,616,017 Probe station thermal chuck with shielding for capacitive current
|
0 |
2007
|
| 7,761,983 Method of assembling a wafer probe
|
1 |
2007
|
| 7,688,062 Probe station
|
0 |
2007
|
| 7,495,461 Wafer probe
|
0 |
2007
|
| 7,456,646 Wafer probe
|
1 |
2007
|
| 7,501,842 Shielded probe for testing a device under test
|
0 |
2007
|
| 7,498,829 Shielded probe for testing a device under test
|
1 |
2007
|
| 7,417,446 Probe for combined signals
|
1 |
2007
|
| 7,969,173 Chuck for holding a device under test
|
1 |
2007
|
| 7,518,358 Chuck for holding a device under test
|
11 |
2007
|
| 7,514,915 Chuck for holding a device under test
|
10 |
2007
|
| 7,501,810 Chuck for holding a device under test
|
10 |
2007
|
| 7,423,419 Chuck for holding a device under test
|
9 |
2007
|
| 7,626,379 Probe station having multiple enclosures
|
1 |
2007
|
| 7,489,149 Shielded probe for testing a device under test
|
1 |
2007
|
| 7,482,823 Shielded probe for testing a device under test
|
1 |
2007
|
| 7,436,194 Shielded probe with low contact resistance for testing a device under test
|
0 |
2007
|
| 7,595,632 Wafer probe station having environment control enclosure
|
5 |
2008
|
| 7,492,175 Membrane probing system
|
3 |
2008
|
| 7,688,091 Chuck with integrated wafer support
|
1 |
2008
|
| 7,514,944 Probe head having a membrane suspended probe
|
1 |
2008
|
| 7,750,652 Test structure and probe for differential signals
|
2 |
2008
|
| 8,013,623 Double sided probing structures
|
0 |
2008
|
| 7,876,114 Differential waveguide probe
|
0 |
2008
|
| 7,759,953 Active wafer probe
|
0 |
2008
|
| 7,888,957 Probing apparatus with impedance optimized interface
|
1 |
2008
|
| 7,898,281 Interface for testing semiconductors
|
0 |
2008
|
| 7,898,273 Probe for testing a device under test
|
0 |
2009
|
| 7,876,115 Chuck for holding a device under test
|
1 |
2009
|
| 7,893,704 Membrane probing structure with laterally scrubbing contacts
|
0 |
2009
|
| 8,319,503 Test apparatus for measuring a characteristic of a device under test
|
0 |
2009
|
| 8,410,806 Replaceable coupon for a probing apparatus
|
0 |
2009
|
| 7,940,069 System for testing semiconductors
|
1 |
2009
|
