Connection method for probe pins for measurement of characteristics of thin-film magnetic head and characteristic measurement method for thin-film magnetic head
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United States of America Patent
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Mar 21, 2006
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N/A
app pub date -
Dec 16, 2003
filing date -
Dec 19, 2002
priority date (Note) -
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Abstract
A method of connecting a plurality of probe pins to a plurality of first external connection pads, which are provided on a head gimbal assembly and are electrically connected to a plurality of terminal electrodes of a write magnetic head element, respectively, and a plurality of second external connection pads, which are provided on the head gimbal assembly and are electrically connected to a plurality of terminal electrodes of a read magnetic head element. In the connection method, an approach direction of the probe pins to the first external connection pads and an approach direction of the probe pins to the second external connection pads are made different from each other.
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