Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Mar 21, 2006
Issued Date -
N/A
app pub date -
Nov 4, 2004
filing date -
May 7, 2002
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An apparatus and a method for the testing of circuit boards, together with a test probe for this apparatus and this method, in which the contact tips of a test finger of a finger tester are monitored during the testing process by an optical detection device and their movement, at least when approaching a part of the circuit board test points of a circuit board to be tested, is corrected on the basis of the result determined by the optical detection device in such a way that the contact tip makes reliable contact with the circuit board test point concerned. The correction data hereby obtained may be used in the calculation of calibration data.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully