Interferometer arrangement and interferometric measuring method
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United States of America Patent
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Mar 21, 2006
Grant Date -
Jun 12, 2003
app pub date -
Nov 25, 2002
filing date -
Nov 24, 2001
priority date (Note) -
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Abstract
The invention relates to an interferometer arrangement (1000) having at least one measuring beam path for providing light in an object area, at least one reference beam path and at least one unit for superposing light of the measuring beam path with light of the reference beam path and a unit for detecting an interference phenomenon caused by light from the object area and light from the reference beam path. The invention further relates to a method for measuring the velocity of an object with an interferometer arrangement. In the interferometer arrangement, the unit for detecting has a spatial resolution which corresponds to the characteristic spatial period of the interference phenomenon. In evaluating the time change of the interference signal, the movement of stray centers can be measured. Use of such an interferometer arrangement in a surgical microscope allows to visualize areas of a field of surgery which cannot be accessed with light in the visible spectrum.
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