Method for estimating and reducing uncertainties in process measurements
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United States of America Patent
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-
Mar 21, 2006
Grant Date -
Mar 18, 2004
app pub date -
Oct 25, 2001
filing date -
Oct 26, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A reference matrix contains valid measurements characterizing operation of a multivariate process (220). Modeling parameters of the reference matrix are derived (222-232). The final model parameters, balanced with respect to measuring and modeling uncertainties (232), are applied to model (204) a new set of measurements (200). If the new set has no faults (206) then all modeled values and modeling uncertainties (208) can be used to control the process (218). If the new set has only one fault (210) ten the modeled value and modeling uncertainty of the faulted measurement plus the measured values and measuring uncertainties of the unfaulted measurements (212) can be used to control the process (218) while repair procedures are implemented for the identified fault (216). If the new set has more than one fault (214) then the process (218) should be shut down, and repair procedures should be implemented (216) for all identified faults.
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