Fabrication of a wavelength locker within a semiconductor structure

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United States of America Patent

PATENT NO 7019332
APP PUB NO 20030015710A1
SERIAL NO

09908888

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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High quality epitaxial layers of monocrystalline materials can be grown overlying monocrystalline substrates such as large silicon wafers by forming a compliant substrate for growing the monocrystalline layers. An accommodating buffer layer comprises a layer of monocrystalline oxide spaced apart from a silicon wafer by an amorphous interface layer of silicon oxide. The amorphous interface layer dissipates strain and permits the growth of a high quality monocrystalline oxide accommodating buffer layer. The accommodating buffer layer is lattice matched to both the underlying silicon wafer and the overlying monocrystalline material layer. Any lattice mismatch between the accommodating buffer layer and the underlying silicon substrate is taken care of by the amorphous interface layer. In addition, formation of a compliant substrate may include utilizing surfactant enhanced epitaxy, epitaxial growth of single crystal silicon onto single crystal oxide, and epitaxial growth of Zintl phase materials. A wavelength locker for stabilizing a wavelength of an optical output signal from an optical transmitter is formed overlying the silicon wafer.

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Patent Owner(s)

  • NXP USA, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Barenburg, Barbara F Gilbert, AZ 6 55
Brophy, Timothy J Holland, PA 14 159
Vieira, Amarildo J C Philadelphia, PA 3 20

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