Photodiode CMOS imager with column-feedback soft-reset for imaging under ultra-low illumination and with high dynamic range
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United States of America Patent
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Mar 28, 2006
Grant Date -
Dec 5, 2002
app pub date -
Nov 16, 2001
filing date -
Nov 16, 2000
priority date (Note) -
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Abstract
The present invention provides a CMOS imager with a reset scheme, by which a CMOS imager generates a sub-kTC noise so that read noise does not depend on the sense node capacitance. By using a column feedback circuit, reset noise can be suppressed to a negligible amount so that photogate APS or CCD-like circuits can achieve noise performance to very efficient value. This scheme allows increasing sense node capacitance without increasing the noise and also achieves a large full-well value without sacrificing read noise performance. The feedback circuit in one of the embodiment of the present invention is located at the column side of the circuit. This design provides a minimal change to the pixel. As a result quantum efficiency or pixel size is not compromised. The present invention allows a CMOS imager to capture scene with high intra-scene contracts under low illumination with high dynamic range.
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