Transmission line input structure test probe
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United States of America Patent
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Mar 28, 2006
Issued Date -
N/A
app pub date -
Nov 22, 2004
filing date -
Dec 21, 2001
priority date (Note) -
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Abstract
A differential electrical test probe tip for sensing a plurality of electric signals and generating a differential signal including an elongate common substrate having a two signal test points at one end and a differential amplifier at the second end. Two transmission lines are on the common substrate, each connecting a respective signal test point a signal input of the differential amplifier. The characteristic impedances of the two transmission lines are substantially equal. In one preferred embodiment, the common substrate is a flexible substrate. In one preferred embodiment an over-mold, which may have gaps therein, at least partially encloses the common substrate, the first transmission line, and the second transmission line.
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