Instruction-based built-in self-test (BIST) of external memory
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United States of America Patent
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Mar 28, 2006
Grant Date -
Jun 24, 2004
app pub date -
Dec 20, 2002
filing date -
Dec 20, 2002
priority date (Note) -
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Abstract
Disclosed are novel methods and apparatus for efficiently providing instruction-based BIST of external memory. In an embodiment, a built-in self-testing system is disclosed. The system includes an external memory module, an on-chip memory controller coupled to the external memory module, an on-chip built-in self-test (BIST) module coupled to the on-chip memory controller, and an interface controller coupled to the BIST module to provide an interface to access the BIST module. The on-chip memory controller may send and receive data to and from the external memory module. And, the BIST module may include an instruction register to store a plurality of instructions.
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