Dynamically adjustable probe tips
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United States of America Patent
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Apr 4, 2006
Grant Date -
N/A
app pub date -
Apr 2, 2003
filing date -
Apr 2, 2003
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Various probe systems and probes are provided. In one aspect, a probe is provided that includes a base and a first member coupled to the base. The first member has a first tip for probing a circuit device. A first actuator is coupled to the first member for moving the first member relative to the base. Electrical and/or topographical probing is possible.
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