Condition assessment and life expectancy prediction for devices
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United States of America Patent
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Apr 4, 2006
Issued Date -
N/A
app pub date -
Jul 25, 2003
filing date -
Apr 15, 1998
priority date (Note) -
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Abstract
Assessing the condition of a device includes receiving signals from a sensor that makes electrical measurements of the device. An expected response of the device is estimated in accordance with the received signals, and a measured response of the device is established in accordance with the received signals. An output residual is calculated according to the expected response and the measured response. The condition of the device is assessed by identifying a fault of the device in accordance with the output residual.
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