Engagement probe having a grouping of projecting apexes for engaging a conductive pad
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United States of America Patent
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Apr 11, 2006
Issued Date -
N/A
app pub date -
Aug 30, 2002
filing date -
Sep 3, 1993
priority date (Note) -
Expired
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Abstract
An exemplary engagement probe having an outer surface comprising a grouping of a plurality of electrically conductive projecting apexes positioned in proximity to one another to engage a single test pad on a semiconductor substrate is described. Constructions are disclosed for testing apparatus comprising an engagement probe having an outer surface comprising a grouping of a plurality of electrically conductive projecting apexes positioned in proximity to one another to engage a single test pad on a semiconductor substrate.
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