Optical sampling measurement apparatus and optical sampling measurement method

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United States of America Patent

PATENT NO 7030352
APP PUB NO 20030223765A1
SERIAL NO

10458781

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A light sampling measurement apparatus comprising a nonlinear optical element supplied with a light to be measured and a sampling light and a light receiving element for receiving a light outputted from the nonlinear optical element, includes: a storage unit for previously storing noise generated in the light receiving element; a calculating unit for obtaining a subtracted noise by subtracting the noise stored in the storage unit, from a measured noise, to calculate a Q value of the light to be measured.

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Patent Owner(s)

  • ANDO ELECTRIC CO., LTD.;YOKOGAWA ELECTRIC CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kanzaki, Masatoshi Yokohama, JP 5 16
Yanagisawa, Yoshiki Yokohama, JP 16 44

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