Accurate testing of temperature measurement unit
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United States of America Patent
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Apr 18, 2006
Grant Date -
Aug 18, 2005
app pub date -
Feb 18, 2004
filing date -
Feb 18, 2004
priority date (Note) -
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Abstract
Various embodiments of a method and apparatus for simulating temperature characteristics of a diode are disclosed. The output of a diode simulator may not depend upon its ambient temperature. Therefore, it may be used to calibrate a temperature measurement unit at any ambient temperature within its operational range regardless of the temperature to which the temperature measurement unit is to be calibrated. Even if the ambient temperature of the facility in which the calibration is performed varies during the calibration procedure, the output of the diode simulator may remain constant. These characteristics of the diode simulator may allow for calibration of a temperature measurement unit in significantly less time than by using prior art methods, which include the requirement to tightly control the temperature of one or more system components.
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