Temperature probe and its use
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United States of America Patent
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May 16, 2006
Grant Date -
May 20, 2004
app pub date -
Nov 10, 2003
filing date -
Nov 12, 2002
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A temperature probe is provided having a sensor element formed from a ceramic substrate and a platinum thin-film resistor arranged thereon. The platinum thin-film resistor is electrically connected with at least two terminal wires, with the at least two terminal wires each being electrically and mechanically connected with a contact pin in a connection area on their side facing away from the sensor element. The diameter of the terminal wires is smaller than the diameter of the contact pins, and the connection area is covered by a glass bead. Use of the temperature probe in a temperature range of about -70.degree. C. to +600.degree. C. is ideal.
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