Device for measuring color, luster and undulations on lacquered freeform surfaces

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7046348
APP PUB NO 20030234920A1
SERIAL NO

10257286

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The invention relates to a device for measuring color, luster and undulations on lacquered freeform surfaces at a predetermined target distance and symmetrically in relation to the measuring point normal lines at a measuring point. Said device is characterized by the provision of a measuring head that can be displaced in three dimensions by at least one motor and that comprises a measuring-head axis, a light emitter and a video camera. The light emitter is provided with a planar light pattern that is to be emitted along its illumination axis. An evaluation unit is provided for the light pattern (reproduction pattern) of the light emitter that is reproduced in the video camera, said evaluation unit emitting a control signal which is dependent on and formed from the distortion produced or the migration of the reproduction pattern. The measuring head is provided with a motor control, to whose input the control signal of the evaluation unit is applied and the measuring head is displaced in order to reduce the distortion or the migration of the reproduction pattern in the video camera to below a predetermined value, in such a way that both the measuring head axis coincides with the measuring point normal lines and the vertex of the angle formed by the illumination axis of the light emitter and the optical axis of the video camera coincides with the measuring point.

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First Claim

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Patent Owner(s)

Patent OwnerAddress
X-RITE GMBH10553 BERLIN

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fleischer, Johannes Berlin, DE 1 1

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