Systems and slurries for chemical mechanical polishing

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United States of America Patent

PATENT NO 7052373
SERIAL NO

11038514

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Abstract

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Systems and methods are disclosed for polishing a semiconductor substrate having a polymer film surface deposited thereon by chemishearing the surface; and performing chemical mechanical polishing (CMP) on the chemisheared surface.

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Patent Owner(s)

Patent OwnerAddress
ANJI MICROELECTRONICS TECHNOLOGY (SHANGHAI) CO LTD201201 T6-9 JINQIAO EXPORT PROCESSING ZONE (SOUTH DISTRICT) NO 5001 EAST CHINA ROAD SHANGHAI PUDONG NEW AREA SHANGHAI CITY SHANGHAI CITY 201201

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yang, Andy Chunxiao Shanghai, CN 5 29
Yu, Chris Chang Shanghai, CN 26 578

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