Independent measurement of complicated transfer functions

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United States of America Patent

PATENT NO 7061219
APP PUB NO 20050275395A1
SERIAL NO

11132460

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Abstract

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A first test signal from a test signal source is provided to a spectrum analyzer to produce first measurement data. The test signal source is expressed by a first transfer function G(w) and the spectrum analyzer is expressed by second transfer function F(w). A second test signal is provided to the spectrum analyzer to produce second measurement data where the second test signal is derived from the first test signal by shifting the frequency by a known increment. From the first and second measurement data, the components are the same on G(w) but different on F(w). The G(w) components are cancelled by calculation using the first and second measurement data and then the second transfer function F(w) is evaluated independently of G(w).

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Patent Owner(s)

Patent OwnerAddress
TEKTRONIX INTERNATIONAL SALES GMBHSWISS NEUHAUSEN NEUHAUSEN AM RHEINFALL KANTON SCHAFFHAUSEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Akita, Yoneo Tokyo, JP 7 21
Miyake, Kenichi Saitama, JP 1 7
Yoshihara, Koichi Tokyo, JP 14 155

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