Concurrently programmable dynamic memory built-in self-test (BIST)
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United States of America Patent
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Jun 13, 2006
Grant Date -
Aug 12, 2004
app pub date -
Feb 7, 2003
filing date -
Feb 7, 2003
priority date (Note) -
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Abstract
Disclosed are novel methods and apparatus for efficiently providing concurrently programmable dynamic memory built-in self-testing (BIST). In an embodiment of the present invention, a method of utilizing a BIST system is disclosed. The method includes: loading setup data into a configuration register; loading a first instruction into a shift register; loading the first instruction into an update register; executing the loaded first instruction to perform a memory test; upon receiving a first update command, loading a second instruction into the shift register; and upon receiving a second update command, loading the second instruction into the update register.
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