Failure analyzing system and method for displaying the failure
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 4, 2006
Grant Date -
Dec 8, 2005
app pub date -
Jun 16, 2004
filing date -
Jun 7, 2004
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A failure analyzing system for displaying a position of a failure in a semiconductor device, includes: a circuit position memory for storing physical positions of respective circuits included in the semiconductor device; a defective information acquisition unit for acquiring information on a defective circuit included in the semiconductor device; and a display for displaying the defective circuit on a layout of the semiconductor device with a color that is different between the physical positions.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully