Inspection method, inspection apparatus, and facility diagnosis unit
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United States of America Patent
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-
Jul 18, 2006
Grant Date -
May 26, 2005
app pub date -
Sep 20, 2004
filing date -
Sep 22, 2003
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
To inspect a status of an inspection object by using an inspection apparatus for extracting amount of characteristic to an inputted waveform signal and determining a status on the basis of the extracted amount of characteristic. Specifically, the inspection apparatus uses a normal knowledge that is generated on the basis of only the data of a normal status at an initial stage to determine whether or not the status of the inspection object complies with the normal status. The inspection apparatus generates an abnormal kind knowledge by abnormal kind on the basis of the data of an abnormal status that are collected in accordance with repeat of the determination, and then, determines the status by using the normal knowledge and the abnormal kind knowledge.
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