Fail judging method for analysis and analyzer
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United States of America Patent
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Aug 1, 2006
Issued Date -
N/A
app pub date -
Nov 18, 2002
filing date -
Nov 20, 2001
priority date (Note) -
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status (Latency Note)
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Abstract
An analyzer (A) includes a measurer (42) for measuring an electro-physical quantity of a sample, and an acceleration measurer (43) for computing the acceleration of change of the electro-physical quantity such as a current measured by the measurer (42). The fail determination as to whether or not a predetermined condition necessary for performing analysis of the sample is satisfied is made based on the acceleration computed by the acceleration measurer (43). As a result, the fail determination in the analysis process of the sample can be performed accurately.
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