Cantilever probe with dual plane fixture and probe apparatus therewith
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Aug 15, 2006
Grant Date -
Jan 12, 2006
app pub date -
Jul 9, 2004
filing date -
Jul 9, 2004
priority date (Note) -
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status (Latency Note)
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Abstract
A cantilever probe has an elbow for bonding to a dual plane fixture plate for a highly stiff and precise angled fixture of the bonded cantilever probe with minimal real estate consumption. The cantilever probe may feature a tip positioning pin and an elbow positioning pin fitting into corresponding holes of the fixture plate and a sacrificial assembly plate. Separate fan-out beams may be attached to the fixture plate and conductively connected to respective elbows once the cantilever probes are fixed. The fan-out beams in turn may be conductively connected with their respective peripheral ends to large pitch apparatus terminals of a circuit board. A probe apparatus may be easily customized by providing varying drill patterns of the positioning holes for fan-out beams and cantilever probes to match pitch requirements of the tested circuit chips.
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