Elastomer spatial light modulators for extreme ultraviolet lithography

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United States of America Patent

PATENT NO 7092138
APP PUB NO 20050146768A1
SERIAL NO

10962055

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A new design and fabrication process of an elastomer spatial light modulator (eSLM). The present invention resolves many known challenges and enables the eSLM to operate as programmable masks for the EUV lithography systems. Bottom electrodes are deposited and patterned on an insulation layer. A sacrificial layer is then deposited, patterned and polished on top of the bottom electrodes. A nitride shell forms a protection layer that prevents out-gassing and degradations of elastomer during operations. The sacrificial layer is removed, forming a cavity. An elastomer is injected at one end of the cavity and pulled into it by capillary forces. In an embodiment, the eSLM comprises a 2-D array of elastomer pillars, each containing a capacitive actuator with an elastomer as the supporting and dielectric structure. A stack of Mo/Si multilayer mirror is deposited on the surface to achieve a high reflectivity about 70% or more in EUV.

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Patent Owner(s)

Patent OwnerAddress
BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY THE1705 EL CAMINO REAL PALO ALTO CA 94306 USA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jung, Il Woong Stanford, CA 6 14
Solgaard, Olav Stanford, CA 94 2978
Wang, Jen-Shiang Stanford, CA 29 152

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