Automated system for designing and testing a probe card
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United States of America Patent
Stats
-
Aug 15, 2006
Grant Date -
Sep 16, 2004
app pub date -
Mar 26, 2004
filing date -
Sep 17, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method and system for designing a probe card from data provided by prospective customers via the Internet is provided. Design specifications are entered into the system by prospective customers and compiled into a database. The collective feasibility of each set of design specifications is determined by an automated computer system and communicated to the prospective customer. If feasible, additional software enables prospective customers to create verification packages according to their respective design specifications. These verification packages further consist of drawing files visually describing the final design and verification files confirming wafer bonding pad data. Verification packages are reviewed and forwarded to an applications engineer after customer approval. An interactive simulation of probe card performance is also provided. Data on probe card performance is incorporated into an overall modeling exercise, which includes not only the probe card, but data on the device(s) under test and wafer, as well as data on automated test equipment.
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