Fault simulator for verifying reliability of test pattern

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United States of America Patent

PATENT NO 7096384
APP PUB NO 20040088627A1
SERIAL NO

10367785

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Abstract

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A fault simulator includes a circuit identifying section that selects, as fault generation points, circuit components subjected to a simulation from timing simulation results obtained by a static timing simulation of an LSI circuit; a fault value computing section that generates delay faults corresponding to the fault generation points using information about delay time and timing of signal transmission in the timing simulation result; and a fault simulating section that performs, by using a test pattern of the simulation, a logic simulation of a normal circuit of the LSI circuit and that of a faulty circuit where the delay faults are inserted into the fault generation points, and verifies detectability of the delay faults by the test pattern from the compared results of both the logic simulations. The fault simulator can reduce the time of the fault simulation.

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Patent Owner(s)

Patent OwnerAddress
RENESAS ELECTRONICS CORPORATIONTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Akamatsu, Yoshikazu Hyogo, JP 2 18
Nishioka, Chika Hyogo, JP 1 3
Ohtake, Hideyuki Hyogo, JP 16 156

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