Method for measuring substance and testing piece

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United States of America Patent

PATENT NO 7098038
APP PUB NO 20030175984A1
SERIAL NO

10384577

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of measuring an analyte, comprising a step of measuring a detectable substance by using a reaction system including a formation reaction of the detectable substance based on a chemical reaction of the analyte contained in a sample, wherein a layered inorganic compound is caused to exist in the reaction system including the formation reaction of the detectable substance, whereby high-sensitivity measurement is made possible, the detectable substance can be stabilized to improve accuracy of the measurement, a rate of a chemical reaction is increased to enable quick measurement, and high-sensitivity measurement is made possible even in a reaction system which forms an insoluble substance. Also, it can be provided an analytical testing piece for measuring an analyte, by measuring a detectable substance by using a reaction system including a formation reaction of the detectable substance based on a chemical reaction of the analyte contained in a sample, wherein the testing piece comprises at least one test portion having a detection portion for detecting the detectable substance and contains a layered inorganic compound at least in the test portion, whereby diffusion and elution of a dyestuff or the like is prevented, more sensitive and accurate simple analysis is made possible, and easy handling is possible.

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Patent Owner(s)

Patent OwnerAddress
ARKRAY INCKYOTO-SHI KYOTO 601-8045

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fukuoka, Takao Kyoto, JP 19 587
Katayama, Atsuko Kyoto, JP 11 484

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