Synchronization of multiple test instruments
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United States of America Patent
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Aug 29, 2006
Grant Date -
Apr 6, 2006
app pub date -
Oct 1, 2004
filing date -
Oct 1, 2004
priority date (Note) -
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Abstract
A test apparatus has multiple instruments that are synchronized with respect to one another so that test data generated by them arrive at the pins of a device under test at the time specified in a test program. The synchronization of the multiple instruments is carried out by introducing delays to triggers that are generated and used by the multiple instruments. The amount of delay that is introduced varies from instrument to instrument and is based on differences in the actual transmission and processing delays and clock rates.
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