Parallel calibration system for a test device
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United States of America Patent
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Sep 12, 2006
Grant Date -
Jan 12, 2006
app pub date -
Jul 8, 2004
filing date -
Jul 8, 2004
priority date (Note) -
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Abstract
A parallel calibration system for an electronic circuit tester comprises test and measurement electronics, a test fixture coupled to the test and measurement electronics, the test fixture comprising clock reference circuitry and clock distribution circuitry, a device under test interface, and a plurality of calibration boards coupled to the device under test interface, wherein the plurality of calibration boards and the clock distribution circuitry simultaneously test the signal paths of a plurality of test channels.
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