Non-contact tester for electronic circuits
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United States of America Patent
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Sep 19, 2006
Issued Date -
N/A
app pub date -
Apr 25, 2005
filing date -
Sep 19, 2002
priority date (Note) -
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Abstract
A non-contact tester for electronic circuits consists of an electronic circuit and independent scanning head, in combination. The electronic circuit includes a micro-fabricated wireless i/o cell and means for sending and receiving signals via the wireless i/o cell. The independent scanning head has a wireless i/o cell that is compatible with the wireless i/o cell on the electronic circuit. This enables data to be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit.
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