Memory cells utilizing metal-to-metal capacitors to reduce susceptibility to single event upsets

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United States of America Patent

PATENT NO 7110281
SERIAL NO

10864240

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Abstract

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Structures and methods of adding metal-to-metal capacitors to static memory cells to reduce susceptibility to SEUs. The addition of metal-to-metal capacitors is particularly suited to programmable logic devices (PLDs), because of the relatively large area required to implement an effective metal-to-metal capacitor, compared (for example) to the size of the static memory cell itself. The configuration memory cells of PLDs are typically placed next to other logic (e.g., the configurable elements controlled by the configuration memory cells) that can be overlain by the metal-to-metal capacitors. Therefore, metal-to-metal capacitors can be used in PLD configuration memory cells where they might be impractical in simple memory arrays. However, metal-to-metal capacitors can also be applied to integrated circuits other than PLDs.

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Patent Owner(s)

Patent OwnerAddress
THOMSON REUTERS GLOBAL RESOURCESSWISS BAR BAAR ZUG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Voogel, Martin L Los Altos, CA 54 847
Young, Steven P Boulder, CO 216 8128

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