Method for identifying an integrated circuit
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United States of America Patent
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Oct 3, 2006
Issued Date -
N/A
app pub date -
Apr 22, 2002
filing date -
Oct 22, 1999
priority date (Note) -
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Abstract
An identifier is provided for an integrated circuit with a memory composed of a multiplicity of memory cells. The circuit has a manufacture-related memory cell defect pattern formed of defective memory cells. The method of identifying the integrated circuit utilizes the memory cell defect pattern to generate a circuit identification number for identifying the integrated circuit.
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