Wavelength reference apparatus and method

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United States of America Patent

PATENT NO 7120176
SERIAL NO

10173514

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Abstract

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Apparatus and methods usable for wavelength references and measurement of wavelength of a light beam. The apparatus comprise at least two wavelength reference or filter elements positioned in a light beam, each wavelength reference element having a different free spectral range and operable to define a joint free spectral range, and a detector positioned in the beam after the wavelength reference elements. The joint free spectral range provided by the multiple wavelength reference elements results in a joint transmission peak that is centered at a unique wavelength, and maximum optical power detectable from the beam by the detector occurs at the center wavelength of the joint transmission peak.

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Patent Owner(s)

Patent OwnerAddress
INTEL CORPORATION2200 MISSION COLLEGE BOULEVARD SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chapman, William B Sunnyvale, CA 23 565
Daiber, Andrew Palo Alto, PA 32 637
McDonald, Mark Milpitas, CA 79 999
Rice, Mark San Jose, CA 21 2091

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