Time delay evaluation
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United States of America Patent
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-
Dec 5, 2006
Grant Date -
Feb 17, 2005
app pub date -
Jul 9, 2003
filing date -
Jul 19, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention concerns a method to evaluate whether a statistical time delay (TD) between a first event and a second event of a device under test is better than a test limit (TL). The method includes the steps: performing a minimum number N of tests and evaluating the time delay (TD) from each test; modeling a first probability distribution (P1) of the evaluated time delays (TD); obtaining a second probability distribution (P2) of the evaluated time delays (TD); performing a statistical transformation in order to obtain a third probability distribution (P3) of the evaluated time delays (TD); and deciding to pass the device under test, if a certain percentage of the area of the third probability distribution (P3) is on a good side (GS) of the test limit (TL2).
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