Systems and methods for testing a device-under-test
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United States of America Patent
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Dec 5, 2006
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app pub date -
Jul 15, 2003
filing date -
Jul 15, 2003
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Abstract
A method for testing a device-under-test (DUT) includes examining a test data file that includes test data for testing the structure, functionality and/or performance of the DUT. The method also includes separating a first plurality of data units from a second plurality of data units contained in the test data file. The first plurality of data units correspond to a first plurality of DUT pins, and the second plurality of data units correspond to a second plurality of DUT pins.
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