Non-volatile memory cell using high-k material inter-gate programming

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United States of America Patent

PATENT NO 7154779
SERIAL NO

10762181

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Abstract

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A non-volatile memory device has a channel region between source/drain regions, a floating gate, a control gate, a first dielectric region between the channel region and the floating gate, and a second dielectric region between the floating gate and the control gate. The first dielectric region includes a high-K material. The non-volatile memory device is programmed and/or erased by transferring charge between the floating gate and the control gate via the second dielectric region.

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Patent Owner(s)

Patent OwnerAddress
SANDISK TECHNOLOGIES LLC6900 DALLAS PARKWAY SUITE 325 PLANO TX 75024

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lutze, Jeffrey W San Jose, CA 96 3674
Mokhlesi, Nima Los Gatos, CA 194 9770

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