Method of correcting transfer of a thin material and a thin material transfer apparatus
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United States of America Patent
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Jan 23, 2007
Grant Date -
N/A
app pub date -
Sep 24, 1998
filing date -
Sep 26, 1997
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A transfer correcting method for a thin material transfer apparatus includes detecting a front end of a thin material by the sensor, and transferring the thin material from a position of the sensor, to a processing unit, and further a reference transfer range from the processing unit to produce a first processed thin material portion, and transferring the thin material the reference transfer range to produce a second processed thin material portion, calculating a first correction value based on the reference transfer range and a measured length of the second processed thin material portion and a second correction value based on measured lengths of the first and second processed thin material portions, and correcting the transfer from the sensor position to the processing unit position, and the transfer from the processing unit position based on based on the first and second correction values.
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