Method and a device for testing electronic memory devices
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jan 23, 2007
Issued Date -
N/A
app pub date -
Mar 30, 2001
filing date -
Mar 31, 2000
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method and control device is used for testing electronic memory devices. The method comprises loading test data and/or instructions into a control logic circuit portion associated with a matrix array of memory cells and integrated storage circuitry. According to the invention, a test operation control device is used temporarily instead of the control logic, the test operation control device being external of and connected detachably to the memory device. Advantageously, the test operation control device is a matrix cell array external of the memory.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully