Circuit property measurement method
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United States of America Patent
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Feb 6, 2007
Grant Date -
Nov 24, 2005
app pub date -
Feb 11, 2005
filing date -
May 18, 2004
priority date (Note) -
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status (Latency Note)
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Abstract
In a high frequency circuit property measurement method, prior to property measurements of a high frequency circuit with RF measurement probe heads, RF measurement probe heads are calibrated using a calibration pattern comprising a signal line having a characteristic impedance and extending on a dielectric substrate, a first GND pad having one end disposed close to and at an interval from a first end of the signal line, a second GND pad having one end disposed close to and at an interval from a second end of the signal line, and a conductor electrically coupling the first GND pad to the second GND pad.
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