Devices and method for spectral measurements

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United States of America Patent

PATENT NO 7180588
SERIAL NO

11075114

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A spectral measurement device comprising an entrance aperture for receiving an electromagnetic energy and a mask located at the entrance aperture in the form of a two-dimensional encodement pattern. An optical element conditions the electromagnetic energy received from the mask for presentation to the spectral dispersion element and the and a spectral dispersion element disperses the electromagnetic energy in one or more dimensions. Additionally, the optical element conditions the dispersed electromagnetic energy onto an array of detector elements.

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Patent Owner(s)

Patent OwnerAddress
PLAIN SIGHT SYSTEMS INC1020 SHERMAN AVENUE HAMDEN CT 06514

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Coifman, Ronald R North Haven, CT 31 1487
Coppi, Andreas Groton, CT 10 469
Deverse, Richard A Kailua Kona, HI 17 644
Fateley, William G Manhattan, KS 34 1429
Geshwind, Frank Madison, CT 28 1551

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