Optical MEMS cavity having a wide scanning range for measuring a sensing interferometer

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United States of America Patent

PATENT NO 7187453
APP PUB NO 20050237538A1
SERIAL NO

10829980

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Abstract

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A method for measuring the cavity length of a remote sensing interferometer by locally replicating the state of the remote sensing interferometer by way of a local interferometer. The local interferometer is produced by micro-electromechanical micro machining techniques, thus obtaining a highly accurate and reliable fiber optic sensing at a cost comparable to electronic sensing devices.

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Patent Owner(s)

Patent OwnerAddress
OPSENS INC750 BOULEVARD DU PARC-TECHNOLOGIQUE QUEBEC G1P 4S3

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Belleville, Claude L'Ancienne-Lorette, CA 31 1073

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